EC415N Mathematical Methods for Signal and Data Processing
Course Name:
EC415N Mathematical Methods for Signal and Data Processing
Programme:
B.Tech (ECE)
Category:
Programme Specific Electives (PSE)
Credits (L-T-P):
(3-0-0) 3
References:
M. Abramovici, M. A. Breuer, and A. D. Friedman, Digital Systems Testing and Testable Design, IEEE
Press, 1994.
M. L. Bushnel and V. D. Agarwal, Essentials of Testing for Digital, Memory and Mixed – Signal VLSI
Circuits, Kluwer Academic Publishers, 2000.
Ajai Jain, Learning Module for the course - VLSI Testing and Testability, IIT, Kanpur, 2001.
Department:
Electronics and Communication Engineering(ECE)